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INSTITUT FÜR FESTKÖRPERFORSCHUNG (IFF)
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INSTITUT ELEKTROKERAMISCHE MATERIALIEN (IEM)
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 Publications of Institute Electrokeramic Materials in 2000
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Schroeder H.; Hiller J.M. In situ study of dislocation behaviour in columnar Al thin films on Si-substrate during thermal cycling Materials Research Society (MRS) Symposium Proceedings 594, 123 (2000) 23.42.0 Andoh H.; Harnach O.; Darula M.; Beuven St.; Kohlstedt H. Superconductivity and its applications: Dynamics of order parameter and microwave emission for a YBa2Cu3O7-delta bicrystal junction Physica C 339/4, 237 (2000) 23.42.0 Franken K.; Maier H.; Prume K.; Waser R. Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads J. Am. Cer. Soc., 83 (6), 1433-40 (2000) 23.42.0 de Gronckel H.A.M.; Kohlstedt H.; Daniels C. Prerequisites for high-quality magnetic tunnel junctions: XPS and NMR study of Co/Al bilayers Appl. Phys. A 70 (4), 435 (2000) 23.42.0 Grossmann M.1; Bolten D.1; Lohse O.1; Böttger U.1; Waser R. 1 Institut für Werkstoffe der Elektrotechnik, RWTH Aachen Correlation between switching and fatigue in PbZr0.3Ti0.7O3 thin films Applied Physics Letters, Vol. 77, No. 12, 1894-1896 23.42.0 Grossmann M.1; Lohse O.1; Bolten D.1; Boettger U.1; Waser R. 1 Institut für Werkstoffe der Elektrotechnik, RWTH Aachen Lifetime estimation due to imprint failure in ferroelectric SrBi2 Ta2O9 thin films Applied Physics Letters, Vol. 76, No.3, 363-365.(2000) 23.42.0 Harnack O.; Darula M.; Beuven St.; Kohlstedt H. Noise and conversion properties of Y-Ba-Cu-O Josephson mixers at operating temperatures above 20 K Appl. Phys. Lett. 76, 1764 (2000) 23.42.0 Hwang S.C.; Waser R. Study of Electrical and Mechanical Contribution to Switching in Ferroelectric/Ferroelastic Polycrystals Acta mater. 48, 3271-3282 (2000) 23.42.0 Liedtke R.1; Grossmann M.1; Waser R. 1 Institut für Werkstoffe der Elektrotechnik, RWTH Aachen Capacitance and admittance spectroscopy analysis of hydrogen-degraded Pt/(Ba,Sr)TiO/Pt thin-film capacitors, Appl. Physics Letters, Vol. 77, No. 13, 2045-2047 23.42.0 Liedtke R.1; Hoffmann S.; Waser R. 1 Institut für Werkstoffe der Elektrotechnik, RWTH Aachen Recrystallization of Oxygen Ion Implanted Ba0,7Sr0,3TiO3 Thin Films Journal of the American Ceramic Society, 83, (2), 436-438 (2000) 23.42.0 Liedtke R.; Hoffmann S.; Waser R. Recrystallization of Oxygen Ion Implanted Ba0.7Sr0.3TiO3 Thin Films J. Am. Ceram. Soc. 83, 436-438 (2000) 23.42.0 Nielen H.; Goebel H.; Eppler I.; Schroeder H.; Schilling W. Stress and plasticity in passivated interconnect lines Proc. Of 5th Int. Workshop on "Stress-induced Phenomena in Metallization", Stuttgart (Germany), AIP Conf. Proc. 491, 277 (1999) 23.42.0 Nordlund K.; Partyka P.; Averback R.S.; Robinson L.K.; Ehrhart P. Atomistic simulation of diffuse x-ray scattering from defects in solids J. Appl. Phys. 88 (2000) 2278-2288 23.42.0 Pertsev N.A.; Koukhar V.G.; Waser R.; Hoffmann S. Curie Weiss-type law for strain and stress effects on the dielectric response of ferroelectric thin films Appl. Phys. Lett. 77, 2596-2598 (2000) 23.42.0 Petzelt J.; Ostapchuk T.; Kamba S.; Rychetsky I.; Savinov M.; Volkov A.; Gorshunov B.; Pronin A.; Hoffmann S.; Waser R.; Lindner J. High-Frequency Dielectric Response of SrTiO3 Crystals, Ceramics and thin Films Ferroelectrics 239, 117 (2000) 23.42.0 Petzelt J.; Ostapchuk T.; Kamba S.; Rychetsky I.; Savinov M.; Volkov A.; Gorshunov B.; Pronin A.; Hoffmann S.; Waser R.;. Lindner J. High-Frequency Dielectric Response of SrTiO3 Crystals, Ceramics and thin Films Ferroelectrics 239, 117 (2000) 23.42.0 Prume K.1; Waser R.; Franken K.; Maier H. 1 Institut für Werkstoffe der Elektrotechnik, RWTH Aachen Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Non-Destructive Failure Test J. Am. Ceram. Soc., 83 (5), 1153-59 (2000) 23.42.0 Rottländer P.; Kohlstedt H.; Grünberg P.; Girgis P. Ultraviolet light oxidation for magnetic tunnel junctions J. Appl. Phys. 87, 6067 (2000) 23.42.0 Rottländer P.; Kohlstedt H.; de Gronckel H.M.A.; Girgis E.; Schelten J.; Grünberg P. Magnetic tunnel junctions prepared by ultravioet light assisted oxidation J. Magn. Magn. Mat. 210, 251 (2000) 23.42.0 Schober T.; Bohn, H.G. Water vapor solubility and electrochemical characterization of the high temperature proton conductor BaZr0.9Y0.1O2.95 Solid State Ionics 127 (2000) 351-360 23.55.0 Schober T.; Szot K.; Barton M.; Kessler B.; Breuer U.1; Penkalla H.J.1; Speier W.1 1 Institut für Chemie und Dynamik der Geosphäre, FZJ Cation loss of BaCa0.393Nb0.606O2.91 in aqueous media: amorphization at room temperature, J. Solid State Chemistry 149, 262-275 (2000) 23.55.0 Schober T.; Szot K.; Barton M.;.Kessler B.; Breuer U.; .Penkalla H.J.; Speier W. Cation Loss of BaCa0.393Nb0.606O2..91 in Aqueous Media: Amorphization at Room Temperature Journal of Solid State Chemistry 149, 262 (2000) 23.42.0 Schäfer P.; Waser R. MOCVD of perovskite thin films using an aerosol-assisted liquid delivery system Adv. Mater. Opt. Electron. 10 (2000) 169-175 23.42.0 Setter N.1; Waser R. 1 EPFL, Lausanne, Switzerland Electroceramic Materials Acta mater. 48, 151-178 (2000) 23.42.0 Singh B.N.; Eldrup M.; Horsewell A.; Ehrhart P.; Dworschak F. On recoil energy dependent void swelling in pure copper: part I. Experimental results Phil. Mag. A 80 (2000) 2629-2650 23.42.0 Slowak R.1; Hoffmann S.; Liedtke R.1; Waser R. 1 Institut für Werkstoffe der Elektrotechnik, RWTH Aachen Functional graded high-K (Ba1-xSrx)TiO3 thin films for capacitor structures with low temperature coefficient Integrated Ferroelectrics 24, 169-179 (1999) 23.42.0 Szot K.; Speier W.; Breuer U.; Meyer R.1; Szade J.; Waser R. 1 Institut für Werkstoffe der Elektrotechnik, RWTH Aachen Formation of micro-crystals on the (100) surface of SrTiO3 at elevated temperatures Surface Science 460, 112 (2000) 23.42.0 Szot K.; Speier W.; Pawelczyk M.; Kwapulinski J.; Huliger J.; Hesse H.; Breuer U.; Quadakkers W.; Chemical inhomogeneity in the near-surface region of KTaO3 J.Phys. : Condens. Matter 12, 4687 (2000) Tyagi A.K.; Szot K.; Czyrska-Filemonowicz A.; Naumenko D.; Quadakkers W.J. Significance of Crystallographic Grain Orientation for Oxide Scale Formation on FeCrAl ODS Alloys studied by AFM TEM and SIMS/SNMS Materials at High Temperatures 17,159 (2000) 23.42.0 Ujma Z.; Szymczak L.; Handerek L.; Szot K.; Penkalla H.J. Dielectric and pyroelectric properties of Nb-doped Pb(Zr0.92Ti0.08)O3 ceramics Journal of the European Ceramic Society 20, 1003 (2000) 23.42.0 Waser R.; Hagenbeck R. Grain Boundaries in Dielectric and Mixed-Conducting Ceramics Overview No. 137, Acta mater. 48, 797-825 (2000) 23.42.0 |
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Forschungszentrum Jülich D-52425 Jülich |
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Institut Elektrokeramische Materialien (IEM) |
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 Materie
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Impressum |
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05.06.2003 
wwwiff@fz-juelich.de
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