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Microstructural and electrical properties of electroceramic thin films deposited by MOCVD
F. Fitsilis, S. Regnery1, P. Ehrhart (BaXSrl-x)TiO3. (BST), is one of the prime candidates as a high-k-dielectric in integrated high-density capacitors for future multi-GBit DRAM memory cells as well as for dielectric tuneable devices and remarkable progress has been achieved in the metal-organic chemical vapor deposition (MOCVD) of thin BST films on a laboratory scale. We report on the performance of a planetary multi-wafer reactor which offers, due to batch mode processing, a high throughput and a low cost of ownership as a production tool. Film growth is discussed within a wide parameter field and the fina1ly achieved electrical properties, e.g., permittivity, loss tangent, leakage current, are discussed in relation to the microstructural properties. |
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Forschungszentrum Jülich, IFF, wwwiff@fz-juelich.de
Letzte Änderung: 21/03/2001, 13.00 URL: <http://www.fz-juelich.de /iff/report/2000-2001/Abstracts/iecabst1.shtml> |