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Spin-Polarized Photoelectron Emission Microscopy of Magnetic Nanostructures
F. Kronast, B. Heitkamp, H.A. Dürr, and W. Eberhardt
The development of high performance magnetic data storage devices requires the further miniaturization of bit sizes and the shortening of read/write cycles. For these future generations of magnetic data storage devices a fundamental understanding of the magnetization dynamics in nanostructures is indispensable. We realized a novel experimental setup which allows us to study the fundamental limits in magnetization dynamics on nm length scales. We operate a photoemission electron microscope (PEEM) with a fs-laser light source. The fs temporal resolution is achieved by laser based pump-probe techniques and the magnetic sensitivity is obtained by analyzing the spin of the emitted photoelectrons. We will present an application of the technique to CoPt nanoscale magnetic dots [6]. |
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Forschungszentrum Jülich, IFF, wwwiff@fz-juelich.de
Letzte Änderung: 01/03/2002, 11.20 URL: <http://www.fz-juelich.de /iff/report/2001-2002/Abstracts/ieeabst3.shtml> |