W. Babik, E. Kentzinger, U. Rücker, G. Goerigk, 0. H. Seek, T. Brückel

X-ray scattering from multilayer structures opens the possibility to determine structural properties such as layer thickness and interface roughness as well as material properties i.e. scattering length densities.
X-ray reflectivity and diffuse scattering was used to characterize monocrystalline, MBE grown Co/Cu/Co multilayers based on a Si(001) waver and a thick Cu(001) buffer.