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@ARTICLE{Liu:138059,
      author       = {Liu, Fei and de Beer, Sissi and van den Ende, Dirk and
                      Mugele, Frieder},
      title        = {{A}tomic force microscopy of confined liquids using the
                      thermal bending fluctuations of the cantilever},
      journal      = {Physical review / E},
      volume       = {87},
      number       = {6},
      issn         = {1539-3755},
      address      = {College Park, Md.},
      publisher    = {APS},
      reportid     = {FZJ-2013-04327},
      pages        = {062406},
      year         = {2013},
      abstract     = {We use atomic force microscopy to measure the
                      distance-dependent solvation forces and the dissipation
                      across liquid films of octamethylcyclotetrasiloxane (OMCTS)
                      confined between a silicon tip and a highly oriented
                      pyrolytic graphite substrate without active excitation of
                      the cantilever. By analyzing the thermal bending
                      fluctuations, we minimize possible nonlinearities of the
                      tip-substrate interaction due to finite excitation
                      amplitudes because these fluctuations are smaller than the
                      typical 1 Å, which is much smaller than the characteristic
                      interaction length. Moreover, we avoid the need to determine
                      the phase lag between cantilever excitation and response,
                      which suffers from complications due to hydrodynamic
                      coupling between cantilever and fluid. Consistent results,
                      and especially high-quality dissipation data, are obtained
                      by analyzing the power spectrum and the time autocorrelation
                      of the force fluctuations. We validate our approach by
                      determining the bulk viscosity of OMCTS using tips with a
                      radius of approximately 1 μm at tip-substrate separations
                      >5 nm. For sharp tips we consistently find an exponentially
                      decaying oscillatory tip-substrate interaction stiffness as
                      well as a clearly nonmonotonic variation of the dissipation
                      for tip-substrate distances up to 8 and 6 nm, respectively.
                      Both observations are in line with the results of recent
                      simulations which relate them to distance-dependent
                      transitions of the molecular structure in the liquid.},
      cin          = {JSC},
      ddc          = {530},
      cid          = {I:(DE-Juel1)JSC-20090406},
      pnm          = {411 - Computational Science and Mathematical Methods
                      (POF2-411)},
      pid          = {G:(DE-HGF)POF2-411},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000320771000002},
      doi          = {10.1103/PhysRevE.87.062406},
      url          = {https://juser.fz-juelich.de/record/138059},
}