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@ARTICLE{Khl:138298,
      author       = {Köhl, Annemarie and Wasmund, H. and Herpers, A. and
                      Guttmann, P. and Werner, S. and Henzler, K. and Du, H. and
                      Mayer, J. and Waser, R. and Dittmann, R.},
      title        = {{E}vidence for multifilamentary valence changes in
                      resistive switching {S}r{T}i{O}3 devices detected by
                      transmission {X}-ray microscopy},
      journal      = {Applied physics letters},
      volume       = {1},
      number       = {4},
      issn         = {1077-3118},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {FZJ-2013-04454},
      pages        = {042102},
      year         = {2013},
      cin          = {PGI-7 / PGI-5 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-7-20110106 / I:(DE-Juel1)PGI-5-20110106 /
                      $I:(DE-82)080009_20140620$},
      pnm          = {421 - Frontiers of charge based Electronics (POF2-421)},
      pid          = {G:(DE-HGF)POF2-421},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000332277600004},
      doi          = {10.1063/1.4822438},
      url          = {https://juser.fz-juelich.de/record/138298},
}