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024 7 _ |a 10.1088/0268-1242/25/7/075001
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024 7 _ |a 1361-6641
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037 _ _ |a FZJ-2013-04810
082 _ _ |a 530
100 1 _ |a Mikulics, Martin
|0 P:(DE-Juel1)128613
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245 _ _ |a Femtosecond and highly sensitive GaAs metal–semiconductor–metal photodetectors grown on aluminum mirrors/pseudo-substrates
260 _ _ |a Bristol
|c 2010
|b IOP Publ.
336 7 _ |a Journal Article
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520 _ _ |a In this study, ultrafast GaAs metal–semiconductor–metal (MSM) photodetectors grown on aluminum mirrors/pseudo-substrates were fabricated and tested. Surface characterization measurements revealed the good quality of the surface morphology, while x-ray diffraction measurements showed several crystallographic orientations of the GaAs layer. The material exhibited a 50 fs carrier lifetime due to growth-induced defects. The response of the photodetectors showed a full width at half maximum of 300 fs. These results demonstrate that the growth of GaAs layers on lattice-mismatched metallic substrates with high thermal conductivity is a promising approach for low-cost and large-area fabrication of electronic and ultrafast photonic devices that require a highly effective thermal drain.
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700 1 _ |a Adam, Roman
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700 1 _ |a Sofer, Zdeněk
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700 1 _ |a Hardtdegen, Hilde
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700 1 _ |a Stanček, Stanislav
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700 1 _ |a Knobbe, Jens
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700 1 _ |a Kočan, Martin
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700 1 _ |a Stejskal, Josef
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700 1 _ |a Sedmidubský, David
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700 1 _ |a Pavlovič, Márius
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700 1 _ |a Nečas, Vladimír
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700 1 _ |a Grützmacher, Detlev
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700 1 _ |a Marso, Michel
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773 _ _ |a 10.1088/0268-1242/25/7/075001
|g Vol. 25, no. 7, p. 075001 -
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|t Semiconductor science and technology
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856 4 _ |z Published final document.
856 4 _ |u https://juser.fz-juelich.de/record/138723/files/FZJ-2013-04810_PV.pdf
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