TY  - JOUR
AU  - Weidlich, Phillip
AU  - Schnedler, Michael
AU  - Eisele, H.
AU  - Strauß, U.
AU  - Dunin-Borkowski, Rafal
AU  - Ebert, Philipp
TI  - Evidence of deep traps in overgrown v-shaped defects in epitaxial GaN layers
JO  - Applied physics letters
VL  - 103
IS  - 6
SN  - 1077-3118
CY  - Melville, NY
PB  - American Institute of Physics
M1  - FZJ-2013-04965
SP  - 062101-1
PY  - 2013
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000322908300035
DO  - DOI:10.1063/1.4816969
UR  - https://juser.fz-juelich.de/record/138894
ER  -