%0 Conference Paper
%A Lehnen, Stephan
%A Paetzold, Ulrich W.
%A Ermes, Markus
%A Bittkau, Karsten
%A Carius, Reinhard
%T "Scanning on a nano scale" - Dual probe near-field optical microscopy
%M FZJ-2013-05320
%D 2013
%B 2013 MRS Spring Meeting & Exhibit
%C 1 Apr 2013 - 5 Apr 2013, San Francisco (USA)
Y2 1 Apr 2013 - 5 Apr 2013
M2 San Francisco, USA
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/139323