TY  - CONF
AU  - Lehnen, Stephan
AU  - Paetzold, Ulrich W.
AU  - Ermes, Markus
AU  - Bittkau, Karsten
AU  - Carius, Reinhard
TI  - "Scanning on a nano scale" - Dual probe near-field optical microscopy
M1  - FZJ-2013-05320
PY  - 2013
T2  - 2013 MRS Spring Meeting & Exhibit
CY  - 1 Apr 2013 - 5 Apr 2013, San Francisco (USA)
Y2  - 1 Apr 2013 - 5 Apr 2013
M2  - San Francisco, USA
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/139323
ER  -