000139376 001__ 139376
000139376 005__ 20250129092350.0
000139376 037__ $$aFZJ-2013-05372
000139376 041__ $$aEnglish
000139376 1001_ $$0P:(DE-Juel1)133962$$aZimmermann, Egon$$b0$$eCorresponding author$$ufzj
000139376 1112_ $$a7th World Congress on Industrial Process Tomography$$cKrakau$$d2013-09-02 - 2013-09-05$$gWCIPT7$$wPolen
000139376 245__ $$aFast EIT data acquisition for geophysical applications
000139376 260__ $$c2013
000139376 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1384771392_17439$$xOther
000139376 3367_ $$033$$2EndNote$$aConference Paper
000139376 3367_ $$2DataCite$$aOther
000139376 3367_ $$2ORCID$$aLECTURE_SPEECH
000139376 3367_ $$2DRIVER$$aconferenceObject
000139376 3367_ $$2BibTeX$$aINPROCEEDINGS
000139376 520__ $$aIn the field of geophysics, spectral electrical impedance tomography is used for structural characterization of soils and rocks. The polarizability of these materials is very low and the frequency range of interest extends from 1 mHz to some kHz. In order to decrease the measurement time, especially for the low frequencies, mathematically orthogonal signals injected simultaneously at all current electrodes will be used. In this contribution, we will discuss the advantages and disadvantages of the method in view of geophysical applications, present a system realization and illustrate the performance regarding the measurement time and phase accuracy in tomographic images.
000139376 536__ $$0G:(DE-HGF)POF2-246$$a246 - Modelling and Monitoring Terrestrial Systems: Methods and Technologies (POF2-246)$$cPOF2-246$$fPOF II$$x0
000139376 7001_ $$0P:(DE-Juel1)129472$$aHuisman, Johan Alexander$$b1$$ufzj
000139376 7001_ $$0P:(DE-Juel1)133890$$aGlaas, Walter$$b2$$ufzj
000139376 7001_ $$0P:(DE-Juel1)142562$$avan Waasen, Stefan$$b3$$ufzj
000139376 909CO $$ooai:juser.fz-juelich.de:139376$$pVDB
000139376 9101_ $$0I:(DE-Juel1)ZEA-2-20090406$$6P:(DE-Juel1)133962$$aZentralinstitut für Elektronik$$b0$$kZEA-2
000139376 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)133962$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000139376 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)129472$$aForschungszentrum Jülich GmbH$$b1$$kFZJ
000139376 9101_ $$0I:(DE-Juel1)ZEA-2-20090406$$6P:(DE-Juel1)133890$$aZentralinstitut für Elektronik$$b2$$kZEA-2
000139376 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)133890$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000139376 9101_ $$0I:(DE-Juel1)ZEA-2-20090406$$6P:(DE-Juel1)142562$$aZentralinstitut für Elektronik$$b3$$kZEA-2
000139376 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)142562$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000139376 9131_ $$0G:(DE-HGF)POF2-246$$1G:(DE-HGF)POF2-240$$2G:(DE-HGF)POF2-200$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bErde und Umwelt$$lTerrestrische Umwelt$$vModelling and Monitoring Terrestrial Systems: Methods and Technologies$$x0
000139376 9141_ $$y2013
000139376 9201_ $$0I:(DE-Juel1)ZEA-2-20090406$$kZEA-2$$lZentralinstitut für Elektronik$$x0
000139376 9201_ $$0I:(DE-Juel1)IBG-3-20101118$$kIBG-3$$lAgrosphäre$$x1
000139376 980__ $$aconf
000139376 980__ $$aVDB
000139376 980__ $$aUNRESTRICTED
000139376 980__ $$aI:(DE-Juel1)ZEA-2-20090406
000139376 980__ $$aI:(DE-Juel1)IBG-3-20101118
000139376 981__ $$aI:(DE-Juel1)PGI-4-20110106
000139376 981__ $$aI:(DE-Juel1)IBG-3-20101118