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000139395 1001_ $$0P:(DE-HGF)0$$aGunes, Mehmet$$b0$$eCorresponding author
000139395 245__ $$aConductance fuctuations in VHF-PECVD grown hydrogenated microcrystalline silicon thin films
000139395 260__ $$aDordrecht [u.a.]$$bSpringer Science + Business Media B.V$$c2003
000139395 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1403097196_30218
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000139395 520__ $$aCoplanar conductance fluctuations or excess noise of undoped hydrogenated microcrystalline silicon (c-Si : H) thin films grown by VHF-PECVD from silane–hydrogen mixtures with silane concentrations from 2% to 6% have been studied between room temperature and 470 K. We report that undoped c-Si : H thin films show similar noise-power spectra to those of undoped a-Si : H films in a coplanar sample geometry. At lower temperatures, the noise with the slope =0.600.07 and at higher temperatures, the noise with the slope close to unity dominate the spectrum. The noise magnitude decreases with decreasing silane concentration and becomes strongly temperature dependent with increased crystallinity.
000139395 536__ $$0G:(DE-HGF)POF2-111$$a111 - Thin Film Photovoltaics (POF2-111)$$cPOF2-111$$fPOF II$$x0
000139395 7001_ $$0P:(DE-HGF)0$$aJohanson, R E$$b1
000139395 7001_ $$0P:(DE-HGF)0$$aKasap, S O$$b2
000139395 7001_ $$0P:(DE-Juel1)130238$$aFinger, F$$b3$$ufzj
000139395 7001_ $$0P:(DE-Juel1)130263$$aLambertz, A$$b4$$ufzj
000139395 773__ $$0PERI:(DE-600)2016994-2$$p731 - 732$$tJournal of materials science / Materials in electronics$$v14$$x0957-4522$$y2003
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000139395 9132_ $$0G:(DE-HGF)POF3-121$$1G:(DE-HGF)POF3-120$$2G:(DE-HGF)POF3-100$$aDE-HGF$$bForschungsbereich Energie$$lErneuerbare Energien$$vSolar cells of the next generation$$x0
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