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@ARTICLE{Gunes:139395,
author = {Gunes, Mehmet and Johanson, R E and Kasap, S O and Finger,
F and Lambertz, A},
title = {{C}onductance fuctuations in {VHF}-{PECVD} grown
hydrogenated microcrystalline silicon thin films},
journal = {Journal of materials science / Materials in electronics},
volume = {14},
issn = {0957-4522},
address = {Dordrecht [u.a.]},
publisher = {Springer Science + Business Media B.V},
reportid = {FZJ-2013-05391},
pages = {731 - 732},
year = {2003},
abstract = {Coplanar conductance fluctuations or excess noise of
undoped hydrogenated microcrystalline silicon (c-Si : H)
thin films grown by VHF-PECVD from silane–hydrogen
mixtures with silane concentrations from $2\%$ to $6\%$ have
been studied between room temperature and 470 K. We report
that undoped c-Si : H thin films show similar noise-power
spectra to those of undoped a-Si : H films in a coplanar
sample geometry. At lower temperatures, the noise with the
slope =0.600.07 and at higher temperatures, the noise with
the slope close to unity dominate the spectrum. The noise
magnitude decreases with decreasing silane concentration and
becomes strongly temperature dependent with increased
crystallinity.},
cin = {IEK-5},
ddc = {600},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {111 - Thin Film Photovoltaics (POF2-111)},
pid = {G:(DE-HGF)POF2-111},
typ = {PUB:(DE-HGF)16},
url = {https://juser.fz-juelich.de/record/139395},
}