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Conference Presentation (Other) FZJ-2013-05407
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Reconstruction of SNOM near-field images from rigorous optical simulations by including topography artifacts

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2013

SPIE Optical Metrology 2013, Munich, , GermanyMunich, , Germany, Germany, 13 May 2013 - 16 May 20132013-05-132013-05-16

Contributing Institute(s):
  1. Photovoltaik (IEK-5)
Research Program(s):
  1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)

Appears in the scientific report 2013
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Document types > Presentations > Conference Presentations
Institute Collections > IMD > IMD-3
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IEK > IEK-5
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 Record created 2013-11-15, last modified 2024-07-08
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