000139623 001__ 139623
000139623 005__ 20240610121330.0
000139623 037__ $$aFZJ-2013-05604
000139623 041__ $$aEnglish
000139623 1001_ $$0P:(DE-Juel1)130627$$aEbert, Philipp$$b0$$eCorresponding author$$ufzj
000139623 1112_ $$aPICO 2013, Second Conference on Frontiers of Abberation Corrected Electron Microscopy$$cKasteel Vaalsbroek$$d2013-10-09 - 2013-10-12$$wNL
000139623 245__ $$aElectronically non-alloyed state of a statistical single atomic layer semiconductor alloy
000139623 260__ $$c2013
000139623 3367_ $$0PUB:(DE-HGF)24$$2PUB:(DE-HGF)$$aPoster$$bposter$$mposter$$s1384955554_32291$$xOther
000139623 3367_ $$033$$2EndNote$$aConference Paper
000139623 3367_ $$2DataCite$$aOutput Types/Conference Poster
000139623 3367_ $$2DRIVER$$aconferenceObject
000139623 3367_ $$2ORCID$$aCONFERENCE_POSTER
000139623 3367_ $$2BibTeX$$aINPROCEEDINGS
000139623 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000139623 7001_ $$0P:(DE-HGF)0$$aLandrock, S.$$b1
000139623 7001_ $$0P:(DE-HGF)0$$aJiang, Y.$$b2
000139623 7001_ $$0P:(DE-HGF)0$$aWu, K. H.$$b3
000139623 7001_ $$0P:(DE-HGF)0$$aWang, E. G.$$b4
000139623 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b5$$ufzj
000139623 909CO $$ooai:juser.fz-juelich.de:139623$$pVDB
000139623 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130627$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000139623 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000139623 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000139623 9141_ $$y2013
000139623 920__ $$lyes
000139623 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000139623 980__ $$aposter
000139623 980__ $$aVDB
000139623 980__ $$aUNRESTRICTED
000139623 980__ $$aI:(DE-Juel1)PGI-5-20110106
000139623 981__ $$aI:(DE-Juel1)ER-C-1-20170209