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001     139623
005     20240610121330.0
037 _ _ |a FZJ-2013-05604
041 _ _ |a English
100 1 _ |a Ebert, Philipp
|0 P:(DE-Juel1)130627
|b 0
|u fzj
|e Corresponding author
111 2 _ |a PICO 2013, Second Conference on Frontiers of Abberation Corrected Electron Microscopy
|c Kasteel Vaalsbroek
|d 2013-10-09 - 2013-10-12
|w NL
245 _ _ |a Electronically non-alloyed state of a statistical single atomic layer semiconductor alloy
260 _ _ |c 2013
336 7 _ |a Poster
|b poster
|m poster
|0 PUB:(DE-HGF)24
|s 1384955554_32291
|2 PUB:(DE-HGF)
|x Other
336 7 _ |a Conference Paper
|0 33
|2 EndNote
336 7 _ |a Output Types/Conference Poster
|2 DataCite
336 7 _ |a conferenceObject
|2 DRIVER
336 7 _ |a CONFERENCE_POSTER
|2 ORCID
336 7 _ |a INPROCEEDINGS
|2 BibTeX
536 _ _ |a 421 - Frontiers of charge based Electronics (POF2-421)
|0 G:(DE-HGF)POF2-421
|c POF2-421
|x 0
|f POF II
700 1 _ |a Landrock, S.
|0 P:(DE-HGF)0
|b 1
700 1 _ |a Jiang, Y.
|0 P:(DE-HGF)0
|b 2
700 1 _ |a Wu, K. H.
|0 P:(DE-HGF)0
|b 3
700 1 _ |a Wang, E. G.
|0 P:(DE-HGF)0
|b 4
700 1 _ |a Dunin-Borkowski, Rafal
|0 P:(DE-Juel1)144121
|b 5
|u fzj
909 C O |o oai:juser.fz-juelich.de:139623
|p VDB
910 1 _ |a Forschungszentrum Jülich GmbH
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)130627
910 1 _ |a Forschungszentrum Jülich GmbH
|0 I:(DE-588b)5008462-8
|k FZJ
|b 5
|6 P:(DE-Juel1)144121
913 1 _ |a DE-HGF
|b Schlüsseltechnologien
|1 G:(DE-HGF)POF2-420
|0 G:(DE-HGF)POF2-421
|2 G:(DE-HGF)POF2-400
|v Frontiers of charge based Electronics
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF2
|l Grundlagen zukünftiger Informationstechnologien
914 1 _ |y 2013
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)PGI-5-20110106
|k PGI-5
|l Mikrostrukturforschung
|x 0
980 _ _ |a poster
980 _ _ |a VDB
980 _ _ |a UNRESTRICTED
980 _ _ |a I:(DE-Juel1)PGI-5-20110106
981 _ _ |a I:(DE-Juel1)ER-C-1-20170209

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