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000139624 041__ $$aEnglish
000139624 1001_ $$0P:(DE-Juel1)130627$$aEbert, Philipp$$b0$$eCorresponding author$$ufzj
000139624 1112_ $$aAtomic Level Characterization Symposium 2013$$cKeauhou / Hawai$$d2013-12-01 - 2013-12-06$$wUSA
000139624 245__ $$aElectronically unmixed state of a statistical two-dimensional Ga-Si semiconductor alloy on Si(111)
000139624 260__ $$c2013
000139624 3367_ $$0PUB:(DE-HGF)24$$2PUB:(DE-HGF)$$aPoster$$bposter$$mposter$$s1384956275_32293$$xOther
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000139624 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000139624 7001_ $$0P:(DE-HGF)0$$aLandrock, S.$$b1
000139624 7001_ $$0P:(DE-HGF)0$$aJiang, Y.$$b2
000139624 7001_ $$0P:(DE-HGF)0$$aWu, K. H.$$b3
000139624 7001_ $$0P:(DE-HGF)0$$aWang, E. G.$$b4
000139624 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b5$$ufzj
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000139624 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130627$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000139624 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
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000139624 9141_ $$y2013
000139624 920__ $$lyes
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