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000139870 0247_ $$2doi$$a10.1142/S1793604713500732
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000139870 037__ $$aFZJ-2013-05841
000139870 041__ $$aEnglish
000139870 082__ $$a540
000139870 1001_ $$0P:(DE-Juel1)156296$$aJakes, Peter$$b0$$ufzj
000139870 245__ $$aEU2+-DOPED CsBr PHOTOSTIMULABLE X-RAY STORAGE PHOSPHORS — ANALYSIS OF DEFECT STRUCTURE BY HIGH-FREQUENCY EPR
000139870 260__ $$aSingapore {[u.a.]$$bWorld Scientific$$c2014
000139870 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1393937510_14513
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000139870 520__ $$aReceived 19 July 2013; Revised ; Accepted 8 October 2013; Published.

Eu2þ-doped CsBr in form of needle image plates is a promising alternative to the granular Eu2þ:BaFBr X-ray storage phosphor
with respect to photo-stimulated luminescence, yield and spatial resolution. However, in order to understand the corresponding
mechanisms on an atomic scale, the defect structure of Eu2þ-doped CsBr photostimulable X-ray storage phosphors has to be
analyzed. By means of high-frequency electron paramagnetic resonance (EPR) spectroscopy, three types of defects have been
observed — an electrically neutral dimeric (...) defect complex and a neutral trimeric (...) defect complex (FZ -center), as well as acceptor-type F-centers (...) that are generated by the trapping of electrons at initially neutral bromine vacancies.

Keywords: X-ray storage phosphors; CsBr; defect structure; Eu2þ-doping; EPR.
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000139870 7001_ $$0P:(DE-HGF)0$$aZimmermann, Jörg$$b1
000139870 7001_ $$0P:(DE-HGF)0$$avon Seggern, Heinz$$b2
000139870 7001_ $$0P:(DE-HGF)0$$aOzarowski, Andrew$$b3
000139870 7001_ $$0P:(DE-HGF)0$$avan Tol, Johan$$b4
000139870 7001_ $$0P:(DE-Juel1)156123$$aEichel, Rüdiger-A.$$b5$$ufzj
000139870 770__ $$aFunctional Materials Letters$$zISSN: 1793-6047
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