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@ARTICLE{Roescher:14008,
      author       = {Roescher, M. and Schneller, T. and Waser, R.},
      title        = {{C}omments on the processing of the niobium omponent for
                      chemical solution derived niobium oxide-based thin films},
      journal      = {Journal of sol gel science and technology},
      volume       = {56},
      issn         = {0928-0707},
      address      = {Dordrecht [u.a.]},
      publisher    = {Springer Science + Business Media B.V},
      reportid     = {PreJuSER-14008},
      pages        = {236 - 243},
      year         = {2010},
      note         = {This work was supported by the Hans. L. Merkle Foundation
                      for the Association for the Promotion of Science and
                      Humanities in Germany (Grant T 113/16679/07).},
      abstract     = {The impact of chemical precursor modification on the
                      electronic properties of chemical solution deposition
                      derived niobium oxide thin-films has been evaluated. It has
                      been found that the application of certain chemical
                      modifications is mandatory in order to obtain electrically
                      insulating thin-films at low processing temperatures. It is
                      emphasized that the devised optimal way of processing for
                      the niobium component is widely contrary to the solution
                      based processing of potassium sodium niobate films reported
                      so far. Regarding the physical nature of the observed
                      instabilities, the phase evolution of solution processed
                      niobium oxide films has been studied. It has been detected
                      that the organic fraction in the precursor solution is
                      stable up to high temperatures and as a result, the low
                      temperature crystalline TT-phase of niobium oxide is
                      preserved up to unusually high processing temperatures. The
                      inherent structural distortion of the unit cells may present
                      a new defect mechanism that has to be further investigated
                      regarding the inferior ferroelectric properties of chemical
                      solution derived potassium sodium niobate thin-films, which
                      are often observed.},
      keywords     = {J (WoSType)},
      cin          = {IFF-6 / JARA-FIT},
      ddc          = {600},
      cid          = {I:(DE-Juel1)VDB786 / $I:(DE-82)080009_20140620$},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Materials Science, Ceramics},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000284611500003},
      doi          = {10.1007/s10971-010-2299-1},
      url          = {https://juser.fz-juelich.de/record/14008},
}