TY  - CONF
AU  - Sachenko, A. V.
AU  - Belyaev, A. E.
AU  - Boltovets, N. S.
AU  - Konakova, R. V.
AU  - Kudryk, Ya. Ya.
AU  - Novitskii, S. V.
AU  - Sheremet, V. N.
AU  - Vinogradov, A. O.
AU  - Li, Jing
AU  - Vitusevich, Svetlana
TI  - A new mechanism of contact resistance formation in ohmic contacts to semiconductors with high dislocation density
VL  - 1566
PB  - AIP Conference Proceedings
M1  - FZJ-2014-00330
SN  - 978-0-7354-1194-4
SP  - 61-62
PY  - 2013
T2  - THE PHYSICS OF SEMICONDUCTORS: Proceedings of the 31st International Conference on the Physics of Semiconductors (ICPS) 2012
CY  - 29 Jul 2012 - 8 Mar 2012, Zurich (Switzerland)
Y2  - 29 Jul 2012 - 8 Mar 2012
M2  - Zurich, Switzerland
LB  - PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
UR  - <Go to ISI:>//WOS:000331793000030
DO  - DOI:10.1063/1.4848285
UR  - https://juser.fz-juelich.de/record/150254
ER  -