%0 Journal Article
%A Tappertzhofen, S.
%A Linn, E.
%A Böttger, U.
%A Waser, R.
%A Valov, Ilia
%T Nanobattery effect in RRAMs-implications on device stability and endurance
%J IEEE electron device letters
%V 35
%@ 1558-0563
%C New York, NY
%I IEEE
%M FZJ-2014-00993
%P 208
%D 2013
%F PUB:(DE-HGF)16
%9 Journal Article
%U https://juser.fz-juelich.de/record/150960