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000150960 1001_ $$0P:(DE-HGF)0$$aTappertzhofen, S.$$b0$$eCorresponding author
000150960 245__ $$aNanobattery effect in RRAMs-implications on device stability and endurance
000150960 260__ $$aNew York, NY$$bIEEE$$c2013
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000150960 7001_ $$0P:(DE-HGF)0$$aBöttger, U.$$b2
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000150960 7001_ $$0P:(DE-Juel1)131014$$aValov, Ilia$$b4$$ufzj
000150960 773__ $$0PERI:(DE-600)2034325-5$$p208$$tIEEE electron device letters$$v35$$x1558-0563
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