%0 Conference Paper
%A Ermes, Markus
%A Lehnen, Stephan
%A Bittkau, Karsten
%A Carius, Reinhard
%T Incorporating the influence of the scanning probe in rigorous simulations by fast post-processing methods
%M FZJ-2014-01115
%D 2014
%B Theory, Modelling and Computational Methods for Semiconductors
%C 22 Jan 2014 - 24 Jan 2014, Manchester (United Kingdom)
Y2 22 Jan 2014 - 24 Jan 2014
M2 Manchester, United Kingdom
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/151092