TY  - CONF
AU  - Ermes, Markus
AU  - Lehnen, Stephan
AU  - Bittkau, Karsten
AU  - Carius, Reinhard
TI  - Incorporating the influence of the scanning probe in rigorous simulations by fast post-processing methods
M1  - FZJ-2014-01115
PY  - 2014
T2  - Theory, Modelling and Computational Methods for Semiconductors
CY  - 22 Jan 2014 - 24 Jan 2014, Manchester (United Kingdom)
Y2  - 22 Jan 2014 - 24 Jan 2014
M2  - Manchester, United Kingdom
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/151092
ER  -