% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@PHDTHESIS{Weidlich:151987,
author = {Weidlich, Phillip},
title = {{S}tructure, electronic properties, and interactions of
defects in epitaxial {G}a{N} layers},
volume = {34},
school = {RWTH Aachen},
type = {Dr.},
address = {Jülich},
publisher = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
reportid = {FZJ-2014-01812},
isbn = {978-3-89336-951-5},
series = {Schriften des Forschungszentrums Jülich. Reihe Information
/ information},
pages = {139 S.},
year = {2014},
note = {RWTH Aachen, Diss., 2013},
abstract = {Gallium nitride (GaN) is a III-V semiconductor which is
widely used in optoelectronic devices, especially in lasers
and light emitting diodes (LEDs). Due to its wide band gap
of approximately 3.4 eV at room temperature [1], GaN - like
related ternary group III-nitride semiconductors - is a
material of choice for the emission of light within the blue
to near ultraviolet range [2]. Due to its application in
ultraviolet LEDs, GaN is deployed in microelectronic
devices, but also finds use in the medical field both for
diagnostic and therapeutic purposes as well as for the
purication of air and water [3]. At present, the efficacy of
devices based on GaN is, however, limited by the quality of
the bulk crystal material. Since there are hardly any large
bulk substrates available [4], almost all GaN films are
grown on substrates which exhibit a large lattice mismatch
as well as a large thermal mismatch using heteroepitaxy or
are deposited onto pseudo substrates which themselves were
nucleated on mismatched substrates [3]. The mismatch induces
high concentrations of defects, of which dislocations
negatively affect the properties of the device in
particular. Dislocations in transistors, for example, can
cause a large reverse bias leakage [5] and threading
dislocations have been associated with luminescence at
various wavelengths in GaN epitaxial layers [6]. Although
group III-nitrides and especially GaN are already being used
commercially in optoelectronic devices, the knowledge of the
general properties of defects within these materials and of
the interactions between the defects in particular is still
limited: The electronic properties of dislocations, for
example, are debated controversially, with different groups
reporting either only charged or only uncharged dislocations
or a mixture of both [7{14] depending on the type of
dislocation as well as on the material investigated. In
addition, various ideas on the origin of charges spanning
from reconstructions of the dislocation cores, impurities,
point defects, to strain [14{21] are being discussed.
Similarly, the electronic [...]},
keywords = {Dissertation (GND)},
cin = {PGI-5},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)11 / PUB:(DE-HGF)3},
url = {https://juser.fz-juelich.de/record/151987},
}