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@PHDTHESIS{Weber:152031,
author = {Weber, Dieter},
title = {{O}xygen transport in thin oxide films at high field
strength},
volume = {33},
school = {RWTH Aachen},
type = {Dissertation},
address = {Jülich},
publisher = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
reportid = {FZJ-2014-01851},
isbn = {978-3-89336-950-8},
series = {Schriften des Forschungszentrums Jülich. Reihe Information
/ information},
pages = {XII, 115 S.},
year = {2014},
note = {RWTH Aachen, Diss., 2014},
abstract = {Ionic transport in nanostructures at high field strength
has recently gained attention, because novel types of
computer memory with potentially superior properties rely on
such phenomena. The applied voltages are only moderate, but
they drop over the distance of a few nanometers and lead to
extreme field strengths in the MV/cm region. Such strong
fields contributes signicantly to the activation energy for
ionic jump processes. This leads to an exponential increase
of transport speed with voltage. Conventional
high-temperature ionic conduction, in contrast, only relies
on thermal activation for such jumps. In this thesis, the
transport of minute amounts of oxygen through a thin
dielectric layer sandwiched between two thin conducting
oxide electrodes was detected semi-quantitatively by
measuring the conductance change of the electrodes after
applyinga current through the dielectric layer. The relative
conductance change $\Delta$G/G as a function of current I
and duration t follows over several orders of magnitude a
simple, empirical law of the form $\Delta$G/G =
CI$^{A}$t$^{B}$ with fit parameters C, A and B; A,B
$\epsilon$ [0,1]. This empirical law can be linked to a
predicted exponential increase of the transport speed with
voltage at high eld strength. The behavior in the time
domain can be explained with a spectrum of relaxation
processes, similar to the relaxation of dielectrics. The
influence of temperature on the transport is strong, but
still much lower than expected. This contradicts a commonly
used law for high-field ionic transport. The different oxide
layers are epitaxial with thicknesses between 5 and 70 nm.
First large-scale test samples were fabricated using shadow
masks. The general behavior of such devices was studied
extensively. In an attempt to achieve quantitative results
with defect-free, miniaturized devices, a lithographic
manufacturing process that uses repeated steps of epitaxial
deposition and structuring of the layers was developed. It
employs newly developed and optimized wet chemical etching
processes for the conducting electrodes. First high-quality
devices could be manufactured with this process and
confirmed that such devices suffer less from parasitic
effects. The lithographically structured samples were made
from different materials. The results from the first test
samples and the lithographically structured samples are
therefore not directly comparable. They do exhibit however
in principle the same behavior. Further investigation of
such lithographically structured samples appears promising.},
keywords = {Dissertation (GND)},
cin = {PGI-5},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)3 / PUB:(DE-HGF)11},
url = {https://juser.fz-juelich.de/record/152031},
}