Gast ::
| Hauptseite > Publikationsdatenbank > Electron energy-loss spectroscopy of boron-doped layers in amorphous thin film silicon solar cells > print |
| Hauptseite > Publikationsdatenbank > Electron energy-loss spectroscopy of boron-doped layers in amorphous thin film silicon solar cells > print |
| 001 | 152034 | ||
| 005 | 20240610121006.0 | ||
| 024 | 7 | _ | |a 10.1063/1.4793587 |2 doi |
| 024 | 7 | _ | |a WOS:000316086500023 |2 WOS |
| 024 | 7 | _ | |a 2128/16799 |2 Handle |
| 037 | _ | _ | |a FZJ-2014-01854 |
| 041 | _ | _ | |a English |
| 082 | _ | _ | |a 530 |
| 100 | 1 | _ | |a Duchamp, Martial |0 P:(DE-Juel1)145413 |b 0 |e Corresponding Author |u fzj |
| 245 | _ | _ | |a Electron energy-loss spectroscopy of boron-doped layers in amorphous thin film silicon solar cells |
| 260 | _ | _ | |a Melville, NY |c 2013 |b American Institute of Physics |
| 336 | 7 | _ | |a article |2 DRIVER |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1396418272_15674 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 520 | _ | _ | |a Electron energy-loss spectroscopy (EELS) is used to study p-doped layers in n-i-p amorphous thin film Si solar cells grown on steel foil substrates. For a solar cell in which an intrinsic amorphous hydrogenated Si (a-Si-H) layer is sandwiched between 10-nm-thick n-doped and p-doped a-Si:H layers, we assess whether core-loss EELS can be used to quantify the B concentration. We compare the shape of the measured B K edge with real space ab initio multiple scattering calculations and show that it is possible to separate the weak B K edge peak from the much stronger Si L edge fine structure by using log-normal fitting functions. The measured B concentration is compared with values obtained from secondary ion mass spectrometry, as well as with EELS results obtained from test samples that contain ∼200-nm-thick a-Si:H layers co-doped with B and C. We also assess whether changes in volume plasmon energy can be related to the B concentration and/or to the density of the material and whether variations of the volume plasmon line-width can be correlated with differences in the scattering of valence electrons in differently doped a-Si:H layers. |
| 536 | _ | _ | |a 424 - Exploratory materials and phenomena (POF2-424) |0 G:(DE-HGF)POF2-424 |c POF2-424 |f POF II |x 0 |
| 700 | 1 | _ | |a Boothroyd, Christopher Brian |0 P:(DE-Juel1)144965 |b 1 |u fzj |
| 700 | 1 | _ | |a Moreno, S. M. |0 P:(DE-HGF)0 |b 2 |
| 700 | 1 | _ | |a van Aken, B. B. |0 P:(DE-HGF)0 |b 3 |
| 700 | 1 | _ | |a Soppe, W. J. |0 P:(DE-HGF)0 |b 4 |
| 700 | 1 | _ | |a Dunin-Borkowski, Rafal |0 P:(DE-Juel1)144121 |b 5 |u fzj |
| 773 | _ | _ | |a 10.1063/1.4793587 |0 PERI:(DE-600)1476463-5 |p 093513 |t Journal of applied physics |v 113 |y 2013 |x 0021-8979 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/152034/files/FZJ-2014-01854.pdf |y OpenAccess |z Published final document. |
| 909 | C | O | |o oai:juser.fz-juelich.de:152034 |p openaire |p open_access |p VDB |p driver |p dnbdelivery |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 0 |6 P:(DE-Juel1)145413 |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 1 |6 P:(DE-Juel1)144965 |
| 910 | 1 | _ | |a Forschungszentrum Jülich GmbH |0 I:(DE-588b)5008462-8 |k FZJ |b 5 |6 P:(DE-Juel1)144121 |
| 913 | 2 | _ | |a DE-HGF |b Forschungsbereich Luftfahrt, Raumfahrt und Verkehr |l Raumfahrt |1 G:(DE-HGF)POF3-420 |0 G:(DE-HGF)POF3-424 |2 G:(DE-HGF)POF3-400 |v Research under Space Conditions |x 0 |
| 913 | 1 | _ | |a DE-HGF |b Schlüsseltechnologien |1 G:(DE-HGF)POF2-420 |0 G:(DE-HGF)POF2-424 |2 G:(DE-HGF)POF2-400 |v Exploratory materials and phenomena |x 0 |4 G:(DE-HGF)POF |3 G:(DE-HGF)POF2 |l Grundlagen zukünftiger Informationstechnologien |
| 914 | 1 | _ | |y 2013 |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |
| 915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0200 |2 StatID |b SCOPUS |
| 915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0110 |2 StatID |b Science Citation Index |
| 915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0111 |2 StatID |b Science Citation Index Expanded |
| 915 | _ | _ | |a OpenAccess |0 StatID:(DE-HGF)0510 |2 StatID |
| 915 | _ | _ | |a JCR/ISI refereed |0 StatID:(DE-HGF)0010 |2 StatID |
| 915 | _ | _ | |a Allianz-Lizenz / DFG |0 StatID:(DE-HGF)0400 |2 StatID |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0300 |2 StatID |b Medline |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)1020 |2 StatID |b Current Contents - Social and Behavioral Sciences |
| 915 | _ | _ | |a Nationallizenz |0 StatID:(DE-HGF)0420 |2 StatID |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Thomson Reuters Master Journal List |
| 920 | _ | _ | |l yes |
| 920 | 1 | _ | |0 I:(DE-Juel1)PGI-5-20110106 |k PGI-5 |l Mikrostrukturforschung |x 0 |
| 980 | 1 | _ | |a FullTexts |
| 980 | _ | _ | |a journal |
| 980 | _ | _ | |a VDB |
| 980 | _ | _ | |a UNRESTRICTED |
| 980 | _ | _ | |a I:(DE-Juel1)PGI-5-20110106 |
| 981 | _ | _ | |a I:(DE-Juel1)ER-C-1-20170209 |
| Library | Collection | CLSMajor | CLSMinor | Language | Author |
|---|