TY  - JOUR
AU  - Kovacs, Andras
AU  - Ney, A.
AU  - Duchamp, Martial
AU  - Ney, V.
AU  - Boothroyd, Christopher Brian
AU  - Galindo, P. L.
AU  - Kaspar, T. C.
AU  - Chambers, S. A.
AU  - Dunin-Borkowski, Rafal
TI  - Defects in paramagnetic Co-doped ZnO films studied by Transmission electron microscopy
JO  - Journal of applied physics
VL  - 114
SN  - 0021-8979
CY  - Melville, NY
PB  - American Institute of Physics
M1  - FZJ-2014-01856
SP  - 243503
PY  - 2013
AB  - We study planar defects in epitaxial Co:ZnO dilute magnetic semiconductor thin films deposited on c-plane sapphire (Al2O3), as well as the Co:ZnO/Al2O3 interface, using aberration-corrected transmission electron microscopy and electron energy-loss spectroscopy. Co:ZnO samples that were deposited using pulsed laser deposition and reactive magnetron sputtering are both found to contain extrinsic stacking faults, incoherent interface structures, and compositional variations within the first 3–4 Co:ZnO layers next to the Al2O3 substrate. The stacking fault density is in the range of 1017 cm−3. We also measure the local lattice distortions around the stacking faults. It is shown that despite the relatively high density of planar defects, lattice distortions, and small compositional variation, the Co:ZnO films retain paramagnetic properties.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000329173200011
DO  - DOI:10.1063/1.4851015
UR  - https://juser.fz-juelich.de/record/152036
ER  -