TY  - JOUR
AU  - Schaab, J.
AU  - Krug, I. P.
AU  - Nickel, F.
AU  - Gottlob, D. M.
AU  - Doğanay, H.
AU  - Cano, A.
AU  - Hentschel, M.
AU  - Yan, Z.
AU  - Bourret, E.
AU  - Schneider, C. M.
AU  - Ramesh, R.
AU  - Meier, D.
TI  - Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy
JO  - Applied physics letters
VL  - 104
IS  - 23
SN  - 1077-3118
CY  - Melville, NY
PB  - American Institute of Physics
M1  - FZJ-2014-03510
SP  - 232904 -
PY  - 2014
AB  - High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established methodfor imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEMand demonstrate its capability for imaging and investigating domain walls in ferroelectrics withhigh spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls canbe visualized based on photo-induced charging effects and local variations in their electronicconductance can be mapped by analyzing the energy distribution of photoelectrons. Our resultsopen the door for non-destructive, contact-free, and element-specific studies of the electronicand chemical structure at domain walls in ferroelectrics.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000337891200068
DO  - DOI:10.1063/1.4879260
UR  - https://juser.fz-juelich.de/record/154112
ER  -