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@ARTICLE{Schaab:154112,
author = {Schaab, J. and Krug, I. P. and Nickel, F. and Gottlob, D.
M. and Doğanay, H. and Cano, A. and Hentschel, M. and Yan,
Z. and Bourret, E. and Schneider, C. M. and Ramesh, R. and
Meier, D.},
title = {{I}maging and characterization of conducting ferroelectric
domain walls by photoemission electron microscopy},
journal = {Applied physics letters},
volume = {104},
number = {23},
issn = {1077-3118},
address = {Melville, NY},
publisher = {American Institute of Physics},
reportid = {FZJ-2014-03510},
pages = {232904 -},
year = {2014},
abstract = {High-resolution X-ray photoemission electron microscopy
(X-PEEM) is a well-established methodfor imaging
ferroelectric domain structures. Here, we expand the scope
of application of X-PEEMand demonstrate its capability for
imaging and investigating domain walls in ferroelectrics
withhigh spatial resolution. Using ErMnO3 as test system, we
show that ferroelectric domain walls canbe visualized based
on photo-induced charging effects and local variations in
their electronicconductance can be mapped by analyzing the
energy distribution of photoelectrons. Our resultsopen the
door for non-destructive, contact-free, and element-specific
studies of the electronicand chemical structure at domain
walls in ferroelectrics.},
cin = {PGI-6},
ddc = {530},
cid = {I:(DE-Juel1)PGI-6-20110106},
pnm = {422 - Spin-based and quantum information (POF2-422)},
pid = {G:(DE-HGF)POF2-422},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000337891200068},
doi = {10.1063/1.4879260},
url = {https://juser.fz-juelich.de/record/154112},
}