Home > Publications database > Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy > print |
001 | 154112 | ||
005 | 20210908140316.0 | ||
024 | 7 | _ | |a 10.1063/1.4879260 |2 doi |
024 | 7 | _ | |a 1077-3118 |2 ISSN |
024 | 7 | _ | |a 0003-6951 |2 ISSN |
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024 | 7 | _ | |a altmetric:2337960 |2 altmetric |
037 | _ | _ | |a FZJ-2014-03510 |
082 | _ | _ | |a 530 |
100 | 1 | _ | |a Schaab, J. |0 P:(DE-HGF)0 |b 0 |e Corresponding Author |
245 | _ | _ | |a Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy |
260 | _ | _ | |a Melville, NY |c 2014 |b American Institute of Physics |
336 | 7 | _ | |a article |2 DRIVER |
336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1631078813_688 |2 PUB:(DE-HGF) |
336 | 7 | _ | |a ARTICLE |2 BibTeX |
336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
520 | _ | _ | |a High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established methodfor imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEMand demonstrate its capability for imaging and investigating domain walls in ferroelectrics withhigh spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls canbe visualized based on photo-induced charging effects and local variations in their electronicconductance can be mapped by analyzing the energy distribution of photoelectrons. Our resultsopen the door for non-destructive, contact-free, and element-specific studies of the electronicand chemical structure at domain walls in ferroelectrics. |
536 | _ | _ | |a 422 - Spin-based and quantum information (POF2-422) |0 G:(DE-HGF)POF2-422 |c POF2-422 |f POF II |x 0 |
588 | _ | _ | |a Dataset connected to CrossRef, juser.fz-juelich.de |
700 | 1 | _ | |a Krug, I. P. |0 P:(DE-HGF)0 |b 1 |
700 | 1 | _ | |a Nickel, F. |0 P:(DE-HGF)0 |b 2 |
700 | 1 | _ | |a Gottlob, D. M. |0 P:(DE-HGF)0 |b 3 |
700 | 1 | _ | |a Doğanay, H. |0 P:(DE-Juel1)140485 |b 4 |
700 | 1 | _ | |a Cano, A. |0 P:(DE-HGF)0 |b 5 |
700 | 1 | _ | |a Hentschel, M. |0 P:(DE-HGF)0 |b 6 |
700 | 1 | _ | |a Yan, Z. |0 P:(DE-HGF)0 |b 7 |
700 | 1 | _ | |a Bourret, E. |0 P:(DE-HGF)0 |b 8 |
700 | 1 | _ | |a Schneider, C. M. |0 P:(DE-Juel1)130948 |b 9 |
700 | 1 | _ | |a Ramesh, R. |0 P:(DE-HGF)0 |b 10 |
700 | 1 | _ | |a Meier, D. |0 P:(DE-HGF)0 |b 11 |
773 | _ | _ | |a 10.1063/1.4879260 |g Vol. 104, no. 23, p. 232904 - |0 PERI:(DE-600)1469436-0 |n 23 |p 232904 - |t Applied physics letters |v 104 |y 2014 |x 1077-3118 |
856 | 4 | _ | |u https://juser.fz-juelich.de/record/154112/files/FZJ-2014-03510.pdf |y OpenAccess |z Published final document. |
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913 | 1 | _ | |a DE-HGF |b Schlüsseltechnologien |l Grundlagen zukünftiger Informationstechnologien |1 G:(DE-HGF)POF2-420 |0 G:(DE-HGF)POF2-422 |3 G:(DE-HGF)POF2 |2 G:(DE-HGF)POF2-400 |4 G:(DE-HGF)POF |v Spin-based and quantum information |x 0 |
913 | 2 | _ | |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-520 |0 G:(DE-HGF)POF3-523 |2 G:(DE-HGF)POF3-500 |v Controlling Configuration-Based Phenomena |x 0 |
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