TY  - JOUR
AU  - Jovanov, Vladislav
AU  - Shrestha, Shailesh
AU  - Hüpkes, Jürgen
AU  - Ermes, Markus
AU  - Bittkau, Karsten
AU  - Knipp, Dietmar
TI  - Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells
JO  - Applied physics express
VL  - 7
IS  - 8
SN  - 1882-0786
CY  - Tokyo
PB  - The Japan Society of Applied Physics
M1  - FZJ-2014-03767
SP  - 082301
PY  - 2014
AB  - The influence of film formation on light-trapping properties of silicon thin-film solar cells prepared on randomly textured substrates was studied. Realistic interface morphologies were calculated with a three-dimensional (3D) surface coverage algorithm using the measured substrate morphology and nominal film thicknesses of the individual layers as input parameters. Calculated interface morphologies were used in finite-difference time-domain simulations to determine the quantum efficiency and absorption in the individual layers of the thin-film solar cells. The investigation shows that a realistic description of interface morphologies is required to accurately predict the light-trapping properties of randomly textured silicon thin-film solar cells.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000341479000008
DO  - DOI:10.7567/APEX.7.082301
UR  - https://juser.fz-juelich.de/record/154420
ER  -