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@ARTICLE{Jovanov:154420,
author = {Jovanov, Vladislav and Shrestha, Shailesh and Hüpkes,
Jürgen and Ermes, Markus and Bittkau, Karsten and Knipp,
Dietmar},
title = {{I}nfluence of film formation on light-trapping properties
of randomly textured silicon thin-film solar cells},
journal = {Applied physics express},
volume = {7},
number = {8},
issn = {1882-0786},
address = {Tokyo},
publisher = {The Japan Society of Applied Physics},
reportid = {FZJ-2014-03767},
pages = {082301},
year = {2014},
abstract = {The influence of film formation on light-trapping
properties of silicon thin-film solar cells prepared on
randomly textured substrates was studied. Realistic
interface morphologies were calculated with a
three-dimensional (3D) surface coverage algorithm using the
measured substrate morphology and nominal film thicknesses
of the individual layers as input parameters. Calculated
interface morphologies were used in finite-difference
time-domain simulations to determine the quantum efficiency
and absorption in the individual layers of the thin-film
solar cells. The investigation shows that a realistic
description of interface morphologies is required to
accurately predict the light-trapping properties of randomly
textured silicon thin-film solar cells.},
cin = {IEK-5},
ddc = {530},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {111 - Thin Film Photovoltaics (POF2-111)},
pid = {G:(DE-HGF)POF2-111},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000341479000008},
doi = {10.7567/APEX.7.082301},
url = {https://juser.fz-juelich.de/record/154420},
}