Hauptseite > Publikationsdatenbank > Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells > print

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024 7 _ |a 1882-0778
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037 _ _ |a FZJ-2014-03767
041 _ _ |a English
082 _ _ |a 530
100 1 _ |a Jovanov, Vladislav
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245 _ _ |a Influence of film formation on light-trapping properties of randomly textured silicon thin-film solar cells
260 _ _ |a Tokyo
|c 2014
|b The Japan Society of Applied Physics
336 7 _ |a Journal Article
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520 _ _ |a The influence of film formation on light-trapping properties of silicon thin-film solar cells prepared on randomly textured substrates was studied. Realistic interface morphologies were calculated with a three-dimensional (3D) surface coverage algorithm using the measured substrate morphology and nominal film thicknesses of the individual layers as input parameters. Calculated interface morphologies were used in finite-difference time-domain simulations to determine the quantum efficiency and absorption in the individual layers of the thin-film solar cells. The investigation shows that a realistic description of interface morphologies is required to accurately predict the light-trapping properties of randomly textured silicon thin-film solar cells.
536 _ _ |a 111 - Thin Film Photovoltaics (POF2-111)
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700 1 _ |a Shrestha, Shailesh
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700 1 _ |a Hüpkes, Jürgen
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700 1 _ |a Ermes, Markus
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700 1 _ |a Bittkau, Karsten
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700 1 _ |a Knipp, Dietmar
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773 _ _ |a 10.7567/APEX.7.082301
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|t Applied physics express
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856 4 _ |u https://juser.fz-juelich.de/record/154420/files/FZJ-2014-03767.pdf
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|v Solar cells of the next generation
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914 1 _ |y 2014
915 _ _ |a JCR/ISI refereed
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