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| Home > Publications database > Periodic Cation Segregation in Cs$_{0.44}$[Nb$_{2.54}$W$_{2.46}$O$_{14}$] Quantified by High-Resolution Scanning Transmission Electron Microscopy > print |
| Home > Publications database > Periodic Cation Segregation in Cs$_{0.44}$[Nb$_{2.54}$W$_{2.46}$O$_{14}$] Quantified by High-Resolution Scanning Transmission Electron Microscopy > print |
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| 100 | 1 | _ | |a Heidelmann, Markus |0 P:(DE-Juel1)157790 |b 0 |e Corresponding Author |u fzj |
| 245 | _ | _ | |a Periodic Cation Segregation in Cs$_{0.44}$[Nb$_{2.54}$W$_{2.46}$O$_{14}$] Quantified by High-Resolution Scanning Transmission Electron Microscopy |
| 260 | _ | _ | |a New York, NY |c 2014 |b Cambridge University Press |
| 336 | 7 | _ | |a Journal Article |b journal |m journal |0 PUB:(DE-HGF)16 |s 1414490075_26056 |2 PUB:(DE-HGF) |
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| 520 | _ | _ | |a The atomic structure of Cs0.44[Nb2.54W2.46O14] closely resembles the structure of the most active catalyst for the synthesis of acrylic acid, the M1 phase of . Consistently with observations made for the latter compound, the high-angle electron scattering signal recorded by scanning transmission electron microscopy shows a significant intensity variation, which repeats periodically with the projected crystallographic unit cell. The occupation factors for the individual mixed Nb/W atomic columns are extracted from the observed intensity variations. For this purpose, experimental images and simulated images are compared on an identical intensity scale, which enables a quantification of the cation distribution. According to our analysis specific sites possess low tungsten concentrations of 25%, whereas other sites have tungsten concentrations above 70%. These findings allow us to refine the existing structure model of the target compound, which has until now described a uniform distribution of the niobium and tungsten atoms in the unit cell, showing that the similarity between Cs0.44[Nb2.54W2.46O14] and the related catalytic compounds also extends to the level of the cation segregation. |
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| 700 | 1 | _ | |a Weirich, Thomas |0 P:(DE-Juel1)131029 |b 3 |u fzj |
| 773 | _ | _ | |a 10.1017/S1431927614001330 |0 PERI:(DE-600)1481716-0 |n 5 |p 1453-1462 |t Microscopy and microanalysis |v 20 |y 2014 |x 1431-9276 |
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