TY  - JOUR
AU  - Divisek, J.
AU  - Steffen, B.
AU  - Stimming, U.
AU  - Schmickler, Wolfgang
TI  - Metal deposition near the tip of a scanning tunneling microscope
JO  - Journal of electroanalytical chemistry
VL  - 440
IS  - 1-2
SN  - 1572-6657
CY  - New York, NY [u.a.]
PB  - Elsevier
M1  - FZJ-2014-04385
SP  - 169 - 172
PY  - 1997
AB  - We have performed model calculations for the deposition of metal ions in the vicinity of the tip of a scanning tunneling microscope. Our results show that near the tip mass transport towards the substrate is greatly reduced. These findings may explain shielding effects that have been observed experimentally.
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1016/S0022-0728(97)80053-8
UR  - https://juser.fz-juelich.de/record/155204
ER  -