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@INPROCEEDINGS{Schierholz:155251,
author = {Schierholz, Roland and Duchamp, Martial and Asunción and
Godinho and Caballero},
title = {{S}pectrum imaging of {H}elium pores in amophous
{S}ilicon-coatings},
school = {Instituto de Ciencia de Materiales de Sevilla},
reportid = {FZJ-2014-04425},
year = {2014},
abstract = {In order to probe the helium distribution in porous
amorphous coatings of silicon grown by magnetron, we present
an extraction method of the Helium signal obtained from
STEM-EELS spectrum images [1]. The goal of the work is to
get a rough estimation of the Helium pressure inside the
pores and correlate this to the deposition parameters. For
this we modified the procedure described by Walsh [2] and
David et al. [3] and integrated this in MATLAB. With our
present architecture it is possible to read in images in dm3
format recorded on a with DigiScan by Gatan and undergo
several data treatment. For our purpose we selected
centering the zero loss peak and integrating it,
deconvolution, fitting of the plasmon intensity with one
narrow peak at ≈ 23 eV attributed to the Silicon bulk
plasmon and a wider one at ≈ 24 to 25 eV to adapt
contributions from surface oxide layer and carbon
contamination, and fitting of the residual intensity arsing
from the He-K edge at ≈ 22 eV with a gaussian. Part of the
procedure is visualized in Figure 2, which shows two spectra
from the same spectrum image one at the matrix position
(Figure 2 (a)) and the other at the pore center (Figure 2
(b)). The spectra were are already deconvoluted and the fit
to the Silicon plasmon is plotted red and the fit for the
SiO2 and the carbon contamination is plotted green. For both
positions the fit is satisfactory and for the pore position
and also the residual signal around 22 eV is well described
by the gaussian fit.The procedure allows to plot maps of all
fitting parameters and also to extract EFTEM images. Figure
1 shows (a) thickness map (b) the gaussian integral and (c)
the gaussian peak position for a selected spectrum image of
a single pore. The Helium density can be derived in two
ways, from the ratio of the Helium K-edge intensity/ to the
ZLP-intensity and by the energy shift of the edge position.
Both methods suffer from large errors around 30 $\%$ so the
cross check is an advantage. We will complete our results by
additional tomography experiments and correlate them to
compositional depth profiles measured with Rutherford
backscattering.},
month = {Jul},
date = {2014-07-07},
organization = {3rd European Conference on NanoFilms
$\&$ Al-NanoFunc final Conference:
Microstructural and chemical
chracterization in the nanoscale.,
Sevilla (Spain), 7 Jul 2014 - 11 Jul
2014},
subtyp = {Other},
cin = {IEK-9},
cid = {I:(DE-Juel1)IEK-9-20110218},
pnm = {123 - Fuel Cells (POF2-123)},
pid = {G:(DE-HGF)POF2-123},
typ = {PUB:(DE-HGF)6},
url = {https://juser.fz-juelich.de/record/155251},
}