%0 Journal Article
%A Fleck, Karsten
%A Bottger, Ulrich
%A Waser, Rainer
%A Menzel, Stephan
%T Interrelation of Sweep and Pulse Analysis of the SET Process in SrTiO$_3$ Resistive Switching Memories
%J IEEE electron device letters
%V 1
%@ 1558-0563
%C New York, NY
%I IEEE
%M FZJ-2014-04653
%P 1 - 1
%D 2014
%X In this letter, we present a study of the SET kinetics of bipolar switching SrTiO3-based resistive memory devices. Pulse measurements on a timescale from 1 (mu ) s to 1 s and voltage sweeps with sweep-rates up to 6 MV/s were performed showing a highly nonlinear correlation between voltage and time. An analytical model is presented that explains the interrelation of both experiments by a comparative analysis of the current–voltage characteristics.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000341574200011
%R 10.1109/LED.2014.2340016
%U https://juser.fz-juelich.de/record/155487