TY  - JOUR
AU  - Fleck, Karsten
AU  - Bottger, Ulrich
AU  - Waser, Rainer
AU  - Menzel, Stephan
TI  - Interrelation of Sweep and Pulse Analysis of the SET Process in SrTiO$_3$ Resistive Switching Memories
JO  - IEEE electron device letters
VL  - 1
SN  - 1558-0563
CY  - New York, NY
PB  - IEEE
M1  - FZJ-2014-04653
SP  - 1 - 1
PY  - 2014
AB  - In this letter, we present a study of the SET kinetics of bipolar switching SrTiO3-based resistive memory devices. Pulse measurements on a timescale from 1 (mu ) s to 1 s and voltage sweeps with sweep-rates up to 6 MV/s were performed showing a highly nonlinear correlation between voltage and time. An analytical model is presented that explains the interrelation of both experiments by a comparative analysis of the current–voltage characteristics.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000341574200011
DO  - DOI:10.1109/LED.2014.2340016
UR  - https://juser.fz-juelich.de/record/155487
ER  -