%0 Conference Paper
%A Dellen, Christian
%A Lobe, Sandra
%A Breuer, Uwe
%A Finsterbusch, Martin
%A Uhlenbruck, Sven
%A Guillon, Olivier
%A Bram, Martin
%T Quantitative ToF-SIMS analysis of a thin film Li-ion conductor
%M FZJ-2014-04833
%D 2014
%B SIMS Europe 2014
%C 7 Sep 2014 - 9 Sep 2014, Münster (Deutschland)
Y2 7 Sep 2014 - 9 Sep 2014
M2 Münster, Deutschland
%F PUB:(DE-HGF)24
%9 Poster
%U https://juser.fz-juelich.de/record/155899