001     156074
005     20210129214207.0
024 7 _ |a 10.1002/pssr.201409221
|2 doi
024 7 _ |a 1862-6270
|2 ISSN
024 7 _ |a 1862-6254
|2 ISSN
024 7 _ |a WOS:000342692300006
|2 WOS
024 7 _ |a altmetric:2846526
|2 altmetric
037 _ _ |a FZJ-2014-04957
082 _ _ |a 530
100 1 _ |a Rodenbücher, Christian
|0 P:(DE-Juel1)142194
|b 0
|e Corresponding Author
|u fzj
245 _ _ |a Fast mapping of inhomogeneities in the popular metallic perovskite Nb:SrTiO 3 by confocal Raman microscopy
260 _ _ |a Weinheim
|c 2014
|b Wiley-VCH
336 7 _ |a Journal Article
|b journal
|m journal
|0 PUB:(DE-HGF)16
|s 1411106643_22737
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
520 _ _ |a Confocal Raman microscopy was applied in order to investigate the homogeneity of donor doping in Nb:SrTiO3 single crystals. Measurements of local Raman spectra revealed a systematic relation between the intensity of the Raman signal and the donor content of the crystals. We successfully elaborated a correspondence between the electronic structure and the intensity of the Raman lines using a crystal with macroscopic inhomogeneity as a demonstration sample. By mapping the distribution of the intensity of the Raman signal, we identified a characteristic inhomogeneous structure related to the presence of clusters with sizes of 5 µm to 20 µm, indicating inhomogeneous donor distribution caused by flaws introduced during crystal growth. Hence, we propose confocal Raman microscopy as a convenient technique for investigating the homogeneity and quality of doped perovskite surfaces, which are needed for various technological applications
536 _ _ |a 421 - Frontiers of charge based Electronics (POF2-421)
|0 G:(DE-HGF)POF2-421
|c POF2-421
|f POF II
|x 0
588 _ _ |a Dataset connected to CrossRef, juser.fz-juelich.de
700 1 _ |a Jauß, Andrea
|0 P:(DE-HGF)0
|b 1
700 1 _ |a Havel, Viktor
|0 P:(DE-HGF)0
|b 2
700 1 _ |a Waser, Rainer
|0 P:(DE-HGF)0
|b 3
700 1 _ |a Szot, Kristof
|0 P:(DE-HGF)0
|b 4
773 _ _ |a 10.1002/pssr.201409221
|g Vol. 08, no. 09, p. 781 - 784
|0 PERI:(DE-600)2259465-6
|n 09
|p 781 - 784
|t Physica status solidi / Rapid research letters
|v 08
|y 2014
|x 1862-6254
856 4 _ |u https://juser.fz-juelich.de/record/156074/files/FZJ-2014-04957.pdf
|y Restricted
909 C O |o oai:juser.fz-juelich.de:156074
|p VDB
910 1 _ |a Forschungszentrum Jülich GmbH
|0 I:(DE-588b)5008462-8
|k FZJ
|b 0
|6 P:(DE-Juel1)142194
910 1 _ |a Forschungszentrum Jülich GmbH
|0 I:(DE-588b)5008462-8
|k FZJ
|b 3
|6 P:(DE-HGF)0
910 1 _ |a Forschungszentrum Jülich GmbH
|0 I:(DE-588b)5008462-8
|k FZJ
|b 4
|6 P:(DE-HGF)0
913 2 _ |a DE-HGF
|b POF III
|l Key Technologies
|1 G:(DE-HGF)POF3-520
|0 G:(DE-HGF)POF3-521
|2 G:(DE-HGF)POF3-500
|v Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|x 0
913 1 _ |a DE-HGF
|b Schlüsseltechnologien
|1 G:(DE-HGF)POF2-420
|0 G:(DE-HGF)POF2-421
|2 G:(DE-HGF)POF2-400
|v Frontiers of charge based Electronics
|x 0
|4 G:(DE-HGF)POF
|3 G:(DE-HGF)POF2
|l Grundlagen zukünftiger Informationstechnologien
914 1 _ |y 2014
915 _ _ |a JCR/ISI refereed
|0 StatID:(DE-HGF)0010
|2 StatID
915 _ _ |a No Peer review
|0 StatID:(DE-HGF)0020
|2 StatID
915 _ _ |a JCR
|0 StatID:(DE-HGF)0100
|2 StatID
915 _ _ |a WoS
|0 StatID:(DE-HGF)0110
|2 StatID
|b Science Citation Index
915 _ _ |a WoS
|0 StatID:(DE-HGF)0111
|2 StatID
|b Science Citation Index Expanded
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0150
|2 StatID
|b Web of Science Core Collection
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0199
|2 StatID
|b Thomson Reuters Master Journal List
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)0200
|2 StatID
|b SCOPUS
915 _ _ |a DBCoverage
|0 StatID:(DE-HGF)1020
|2 StatID
|b Current Contents - Social and Behavioral Sciences
920 1 _ |0 I:(DE-Juel1)PGI-7-20110106
|k PGI-7
|l Elektronische Materialien
|x 0
980 _ _ |a journal
980 _ _ |a VDB
980 _ _ |a I:(DE-Juel1)PGI-7-20110106
980 _ _ |a UNRESTRICTED


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21