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@ARTICLE{Duden:156203,
author = {Duden, Thomas and Thust, Andreas and Kumpf, Christian and
Tautz, Frank Stefan},
title = {{F}ocal-{S}eries {R}econstruction in {L}ow-{E}nergy
{E}lectron {M}icroscopy},
journal = {Microscopy and microanalysis},
volume = {20},
issn = {1431-9276},
address = {New York, NY},
publisher = {Cambridge University Press},
reportid = {FZJ-2014-05043},
pages = {968 - 973},
year = {2014},
abstract = {In low-energy electron microscopy (LEEM) we commonly
encounter images which, beside amplitude contrast, also show
signatures of phase contrast. The images are usually
interpreted by following the evolution of the contrast
during the experiment, and assigning gray levels to
morphological changes. Through reconstruction of the exit
wave, two aspects of LEEM can be addressed: (1) the
resolution can be improved by exploiting the full
information limit of the microscope and (2) electron phase
shifts which contribute to the image contrast can be
extracted. In this article, linear exit wave reconstruction
from a through-focal series of LEEM images is demonstrated.
As a model system we utilize a heteromolecular monolayer
consisting of the organic molecules 3,4,9,10-perylene
tetracarboxylic dianhydride and Cu-II-Phthalocyanine,
adsorbed on a Ag(111) surface.},
cin = {PGI-5},
ddc = {570},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)},
pid = {G:(DE-HGF)POF2-42G41},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000339158700040},
doi = {10.1017/S1431927614000403},
url = {https://juser.fz-juelich.de/record/156203},
}