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000015825 084__ $$2WoS$$aInstruments & Instrumentation
000015825 084__ $$2WoS$$aPhysics, Applied
000015825 1001_ $$0P:(DE-Juel1)VDB75516$$aMorawski, I.$$b0$$uFZJ
000015825 245__ $$aVoltage preamplifier for extensional quarz sensors used in scanning force microscopy
000015825 260__ $$a[S.l.]$$bAmerican Institute of Physics$$c2011
000015825 300__ $$a063701
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000015825 440_0 $$05309$$aReview of Scientific Instruments$$v82$$x0034-6748$$y6
000015825 500__ $$3POF3_Assignment on 2016-02-29
000015825 500__ $$aThis project was supported by a JARA-Start grant. The authors are indebted to Dr. D. Mayer for technical assistance in the impedance measurements and to Dr. H. J. Krause for help with the spectral noise density measurements. We also thank H. P. Bochem for the electron microscopy imaging of the sensors and the tips.
000015825 520__ $$aExtensional-mode quartz resonators are being increasingly used as force sensors in dynamic scanning force microscopy or atomic force microscopy (AFM). We propose a voltage preamplifier in order to amplify the charge induced on quartz electrodes. The proposed solution has some advantages over the typically used current-to-voltage converters. First, the gain does not depend on the inner parameters of the quartz resonator, which are usually unknown for the specific resonator and may even vary during the measurement. Second, with such an amplifier a better signal-to-noise ratio can be achieved. Finally, we present AFM images of the Si(111) and the SiO(2) surfaces obtained by the voltage preamplifier with simultaneously recorded tunneling current.
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000015825 7001_ $$0P:(DE-HGF)0$$aBlicharski, J.$$b1
000015825 7001_ $$0P:(DE-Juel1)VDB5601$$aVoigtländer, B.$$b2$$uFZJ
000015825 773__ $$0PERI:(DE-600)1472905-2$$a10.1063/1.3594103$$gVol. 82, p. 063701$$p063701$$q82<063701$$tReview of scientific instruments$$v82$$x0034-6748$$y2011
000015825 8567_ $$uhttp://dx.doi.org/10.1063/1.3594103
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