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| Hauptseite > Publikationsdatenbank > Voltage preamplifier for extensional quarz sensors used in scanning force microscopy > print |
| Hauptseite > Publikationsdatenbank > Voltage preamplifier for extensional quarz sensors used in scanning force microscopy > print |
| 001 | 15825 | ||
| 005 | 20180208231917.0 | ||
| 024 | 7 | _ | |a pmid:21721696 |2 pmid |
| 024 | 7 | _ | |a 10.1063/1.3594103 |2 DOI |
| 024 | 7 | _ | |a WOS:000292334000030 |2 WOS |
| 024 | 7 | _ | |a 2128/7308 |2 Handle |
| 037 | _ | _ | |a PreJuSER-15825 |
| 041 | _ | _ | |a eng |
| 082 | _ | _ | |a 530 |
| 084 | _ | _ | |2 WoS |a Instruments & Instrumentation |
| 084 | _ | _ | |2 WoS |a Physics, Applied |
| 100 | 1 | _ | |a Morawski, I. |b 0 |u FZJ |0 P:(DE-Juel1)VDB75516 |
| 245 | _ | _ | |a Voltage preamplifier for extensional quarz sensors used in scanning force microscopy |
| 260 | _ | _ | |a [S.l.] |b American Institute of Physics |c 2011 |
| 300 | _ | _ | |a 063701 |
| 336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a article |2 DRIVER |
| 440 | _ | 0 | |a Review of Scientific Instruments |x 0034-6748 |0 5309 |y 6 |v 82 |
| 500 | _ | _ | |3 POF3_Assignment on 2016-02-29 |
| 500 | _ | _ | |a This project was supported by a JARA-Start grant. The authors are indebted to Dr. D. Mayer for technical assistance in the impedance measurements and to Dr. H. J. Krause for help with the spectral noise density measurements. We also thank H. P. Bochem for the electron microscopy imaging of the sensors and the tips. |
| 520 | _ | _ | |a Extensional-mode quartz resonators are being increasingly used as force sensors in dynamic scanning force microscopy or atomic force microscopy (AFM). We propose a voltage preamplifier in order to amplify the charge induced on quartz electrodes. The proposed solution has some advantages over the typically used current-to-voltage converters. First, the gain does not depend on the inner parameters of the quartz resonator, which are usually unknown for the specific resonator and may even vary during the measurement. Second, with such an amplifier a better signal-to-noise ratio can be achieved. Finally, we present AFM images of the Si(111) and the SiO(2) surfaces obtained by the voltage preamplifier with simultaneously recorded tunneling current. |
| 536 | _ | _ | |a Grundlagen für zukünftige Informationstechnologien |c P42 |2 G:(DE-HGF) |0 G:(DE-Juel1)FUEK412 |x 0 |
| 588 | _ | _ | |a Dataset connected to Web of Science, Pubmed |
| 650 | _ | 7 | |a J |2 WoSType |
| 700 | 1 | _ | |a Blicharski, J. |b 1 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Voigtländer, B. |b 2 |u FZJ |0 P:(DE-Juel1)VDB5601 |
| 773 | _ | _ | |a 10.1063/1.3594103 |g Vol. 82, p. 063701 |p 063701 |q 82<063701 |0 PERI:(DE-600)1472905-2 |t Review of scientific instruments |v 82 |y 2011 |x 0034-6748 |
| 856 | 7 | _ | |u http://dx.doi.org/10.1063/1.3594103 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/15825/files/FZJ-15825.pdf |y Published under German "Allianz" Licensing conditions on 2011-06-02. Available in OpenAccess from 2011-06-02 |z Published final document. |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/15825/files/FZJ-15825.jpg?subformat=icon-1440 |x icon-1440 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/15825/files/FZJ-15825.jpg?subformat=icon-180 |x icon-180 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/15825/files/FZJ-15825.jpg?subformat=icon-640 |x icon-640 |
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| 914 | 1 | _ | |y 2011 |
| 915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
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| 915 | _ | _ | |a Allianz-OA |0 StatID:(DE-HGF)0520 |2 StatID |
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| 980 | _ | _ | |a UNRESTRICTED |
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| 981 | _ | _ | |a I:(DE-Juel1)VDB881 |
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