%0 Conference Paper
%A Pud, S.
%A Li, J.
%A Petrychuk, M.
%A Feste, S.
%A Offenhäusser, A.
%A Mantl, S.
%A Vitusevich, S.
%T Noise Spectroscopy of Traps in Silicon Nanowire Field-Effect Transistors
%M PreJuSER-15926
%D 2011
%Z Record converted from VDB: 12.11.2012
%< Proceedings of International Conference on Noise and Fluctuations (ICNF 2011)  Toronto,Canada: 12-16 June 2011, IEEE Catalog Number: CEP 1192N-CDR. - 978-1-4577-0191-7. - S.242 - 245
%F PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
%9 Contribution to a conference proceedingsContribution to a book
%U https://juser.fz-juelich.de/record/15926