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000015926 245__ $$aNoise Spectroscopy of Traps in Silicon Nanowire Field-Effect Transistors
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000015926 29510 $$aProceedings of International Conference on Noise and Fluctuations (ICNF 2011)  Toronto,Canada: 12-16 June 2011, IEEE Catalog Number: CEP 1192N-CDR. - 978-1-4577-0191-7. - S.242 - 245
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