guest ::
| Home > Publications database > Analysis of transient currents during ultrafast switching of TiO2 nanocrossbar devices > print |
| Home > Publications database > Analysis of transient currents during ultrafast switching of TiO2 nanocrossbar devices > print |
| 001 | 16035 | ||
| 005 | 20180208221305.0 | ||
| 024 | 7 | _ | |2 DOI |a 10.1109/LED.2011.2156377 |
| 024 | 7 | _ | |2 WOS |a WOS:000293710400041 |
| 024 | 7 | _ | |2 ISSN |a 0741-3106 |
| 037 | _ | _ | |a PreJuSER-16035 |
| 041 | _ | _ | |a eng |
| 082 | _ | _ | |a 620 |
| 084 | _ | _ | |2 WoS |a Engineering, Electrical & Electronic |
| 100 | 1 | _ | |a Hermes, C. |b 0 |u FZJ |0 P:(DE-Juel1)VDB95140 |
| 245 | _ | _ | |a Analysis of transient currents during ultrafast switching of TiO2 nanocrossbar devices |
| 260 | _ | _ | |c 2011 |a New York, NY |b IEEE |
| 300 | _ | _ | |a 1116 - 1118 |
| 336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a article |2 DRIVER |
| 440 | _ | 0 | |a IEEE Electron Device Letters |x 0741-3106 |0 2464 |y 8 |v 32 |
| 500 | _ | _ | |3 POF3_Assignment on 2016-02-29 |
| 500 | _ | _ | |a Manuscript received April 21, 2011; revised May 6, 2011; accepted May 8, 2011. Date of publication June 23, 2011; date of current version July 27, 2011. This work was supported by Intel Corporation, USA. The review of this letter was arranged by Editor A. Ortiz-Conde. |
| 520 | _ | _ | |a In this letter, bipolar fast-pulse switching in TiO2-based nanocrossbar devices was investigated. A dedicated measurement setup was used to measure the transient currents during 5-ns resistive switching. Transient peak currents for the SET and RESET processes were as high as 200 and 230 mu A, respectively. The currents observed during fast-pulse switching are explained and simulated by Joule heating, which is needed for fast oxygen-vacancy movement. The measured transient currents enable a further optimization of resistive switches based on TiO2 |
| 536 | _ | _ | |a Grundlagen für zukünftige Informationstechnologien |c P42 |2 G:(DE-HGF) |0 G:(DE-Juel1)FUEK412 |x 0 |
| 588 | _ | _ | |a Dataset connected to Web of Science |
| 650 | _ | 7 | |a J |2 WoSType |
| 653 | 2 | 0 | |2 Author |a Fast pulses |
| 653 | 2 | 0 | |2 Author |a nanocrossbar device |
| 653 | 2 | 0 | |2 Author |a resistive switching |
| 653 | 2 | 0 | |2 Author |a TiO2 |
| 653 | 2 | 0 | |2 Author |a transient current |
| 700 | 1 | _ | |a Wimmer, M. |b 1 |u FZJ |0 P:(DE-Juel1)VDB94556 |
| 700 | 1 | _ | |a Menzel, S. |b 2 |u FZJ |0 P:(DE-Juel1)158062 |
| 700 | 1 | _ | |a Fleck, K. |b 3 |u FZJ |0 P:(DE-Juel1)VDB99840 |
| 700 | 1 | _ | |a Gruns, G. |b 4 |u FZJ |0 P:(DE-Juel1)VDB99841 |
| 700 | 1 | _ | |a Salinga, M. |b 5 |u FZJ |0 P:(DE-Juel1)VDB93142 |
| 700 | 1 | _ | |a Böttger, U. |b 6 |u FZJ |0 P:(DE-Juel1)VDB3024 |
| 700 | 1 | _ | |a Bruchhaus, R. |b 7 |u FZJ |0 P:(DE-Juel1)130570 |
| 700 | 1 | _ | |a Schmitz-Kempen, T. |b 8 |0 P:(DE-HGF)0 |
| 700 | 1 | _ | |a Wuttig, M. |b 9 |u FZJ |0 P:(DE-Juel1)VDB11965 |
| 700 | 1 | _ | |a Waser, R. |b 10 |u FZJ |0 P:(DE-Juel1)131022 |
| 773 | _ | _ | |0 PERI:(DE-600)2034325-5 |a 10.1109/LED.2011.2156377 |g Vol. 32, p. 1116 - 1118 |p 1116 - 1118 |q 32<1116 - 1118 |t IEEE Electron Device Letters |v 32 |x 0741-3106 |y 2011 |
| 856 | 7 | _ | |u http://dx.doi.org/10.1109/LED.2011.2156377 |
| 909 | C | O | |o oai:juser.fz-juelich.de:16035 |p VDB |
| 913 | 1 | _ | |k P42 |v Grundlagen für zukünftige Informationstechnologien |l Grundlagen für zukünftige Informationstechnologien (FIT) |b Schlüsseltechnologien |0 G:(DE-Juel1)FUEK412 |x 0 |
| 913 | 2 | _ | |a DE-HGF |b Key Technologies |l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT) |1 G:(DE-HGF)POF3-520 |0 G:(DE-HGF)POF3-529H |2 G:(DE-HGF)POF3-500 |v Addenda |x 0 |
| 914 | 1 | _ | |y 2011 |
| 915 | _ | _ | |a JCR/ISI refereed |0 StatID:(DE-HGF)0010 |2 StatID |
| 915 | _ | _ | |a JCR |0 StatID:(DE-HGF)0100 |2 StatID |
| 915 | _ | _ | |a WoS |0 StatID:(DE-HGF)0111 |2 StatID |b Science Citation Index Expanded |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0150 |2 StatID |b Web of Science Core Collection |
| 915 | _ | _ | |a DBCoverage |0 StatID:(DE-HGF)0199 |2 StatID |b Thomson Reuters Master Journal List |
| 920 | 1 | _ | |0 I:(DE-Juel1)PGI-7-20110106 |k PGI-7 |l Elektronische Materialien |g PGI |x 0 |
| 920 | 1 | _ | |0 I:(DE-82)080009_20140620 |k JARA-FIT |l Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology |g JARA |x 1 |
| 970 | _ | _ | |a VDB:(DE-Juel1)129556 |
| 980 | _ | _ | |a VDB |
| 980 | _ | _ | |a ConvertedRecord |
| 980 | _ | _ | |a journal |
| 980 | _ | _ | |a I:(DE-Juel1)PGI-7-20110106 |
| 980 | _ | _ | |a I:(DE-82)080009_20140620 |
| 980 | _ | _ | |a UNRESTRICTED |
| 981 | _ | _ | |a I:(DE-Juel1)VDB881 |
| Library | Collection | CLSMajor | CLSMinor | Language | Author |
|---|