001     16343
005     20200423203024.0
017 _ _ |a This version is available at the following Publisher URL: http://jap.aip.org
024 7 _ |a 10.1063/1.1421219
|2 DOI
024 7 _ |a WOS:000173418500088
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024 7 _ |a 2128/1216
|2 Handle
024 7 _ |a altmetric:11744562
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037 _ _ |a PreJuSER-16343
041 _ _ |a eng
082 _ _ |a 530
084 _ _ |2 WoS
|a Physics, Applied
100 1 _ |a Ganpule, C. S.
|b 0
|u FZJ
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245 _ _ |a Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films
260 _ _ |a Melville, NY
|b American Institute of Physics
|c 2002
300 _ _ |a 1477 - 1481
336 7 _ |a Journal Article
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440 _ 0 |a Journal of Applied Physics
|x 0021-8979
|0 3051
|y 3
|v 91
500 _ _ |a Record converted from VDB: 12.11.2012
520 _ _ |a Voltage-modulated scanning force microscopy (Piezoresponse microscopy) is applied to investigate the domain structure in epitaxial PbZr0.2Ti0.8O3 ferroelectric thin films grown on (001) SrTiO3. By monitoring the vertical and lateral differential signals from the photodetector of the atomic force microscope it is possible to separate out and observe the out-of-plane and in-plane polarization vectors in the thin film individually. The relative orientation of the polarization vectors across a 90degrees domain wall is observed. Nucleation of new reversed 180degrees domains at the 90degrees domain wall is studied and its impact on the rotation of polarization within the a domain is analyzed as a function of reversal time. (C) 2002 American Institute of Physics.
536 _ _ |a Methoden und Systeme der Informationstechnik
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700 1 _ |a Nagaranjan, V.
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700 1 _ |a Hill, B. K.
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700 1 _ |a Roytburd, A. L.
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700 1 _ |a Williams, E. D.
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700 1 _ |a Ramesh, R.
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700 1 _ |a Alpay, S. P.
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700 1 _ |a Roelofs, A.
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700 1 _ |a Waser, R.
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700 1 _ |a Eng, L. M.
|b 9
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773 _ _ |a 10.1063/1.1421219
|g Vol. 91, p. 1477 - 1481
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|t Journal of applied physics
|v 91
|y 2002
|x 0021-8979
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