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000016631 1001_ $$0P:(DE-Juel1)VDB75717$$aSoni, R.$$b0$$uFZJ
000016631 245__ $$aOn the stochastic nature of resistive switching in Cu doped Ge0.3Se0.7 based memory devices
000016631 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2011
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000016631 440_0 $$03051$$aJournal of Applied Physics$$v110$$x0021-8979
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000016631 520__ $$aCurrently, there is great interest in using solid electrolytes to develop resistive switching based nonvolatile memories (RRAM) and logic devices. Despite recent progress, our understanding of the microscopic origin of the switching process and its stochastic behavior is still limited. In order to understand this behavior, we present a statistical "breakdown" analysis performed on Cu doped Ge0.3Se0.7 based memory devices under elevated temperature and constant voltage stress conditions. Following the approach of electrochemical phase formation, the precursor of the "ON resistance switching" is considered to be nucleation - the emergence of small clusters of atoms carrying the basic properties of the new phase which forms the conducting filament. Within the framework of nucleation theory, the observed fluctuations in the time required for "ON resistance switching" are found to be consistent with the stochastic nature of critical nucleus formation. (C) 2011 American Institute of Physics. [doi:10.1063/1.3631013]
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000016631 7001_ $$0P:(DE-Juel1)130836$$aMeuffels, P.$$b1$$uFZJ
000016631 7001_ $$0P:(DE-Juel1)VDB13645$$aStaikov, G.$$b2$$uFZJ
000016631 7001_ $$0P:(DE-Juel1)VDB75716$$aWeng, R.$$b3$$uFZJ
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000016631 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b7$$uFZJ
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000016631 773__ $$0PERI:(DE-600)1476463-5$$a10.1063/1.3631013$$gVol. 110, p. 054509$$p054509$$q110<054509$$tJournal of applied physics$$v110$$x0021-8979$$y2011
000016631 8567_ $$uhttp://dx.doi.org/10.1063/1.3631013
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