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000016880 084__ $$2WoS$$aPhysics, Applied
000016880 1001_ $$0P:(DE-Juel1)2402$$aSchulte, M.$$b0$$uFZJ
000016880 245__ $$aAngular resolved scattering by a nano-textured ZnO/silicon interface
000016880 260__ $$aMelville, NY$$bAmerican Institute of Physics$$c2011
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000016880 440_0 $$0562$$aApplied Physics Letters$$v99$$x0003-6951$$y11
000016880 500__ $$aWe thank Markus Hulsbeck, Astrid Besmehn, Matthias Meier, and Xu Xu for their contributions to this publication and the fruitful discussions. Furthermore, we thank Hugo Schlich from the Mateck GmbH for polishing the rough microcrystalline Si surface. Financial support by the BMU (Project No. 0327625) and Nuon Helianthos is gratefully acknowledged.
000016880 520__ $$aTextured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell's equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell's equations. (C) 2011 American Institute of Physics. [doi:10.1063/1.3640238]
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000016880 7001_ $$0P:(DE-Juel1)130219$$aBittkau, K.$$b1$$uFZJ
000016880 7001_ $$0P:(DE-HGF)0$$aJäger, K.$$b2
000016880 7001_ $$0P:(DE-Juel1)VDB101525$$aErmes, M.$$b3$$uFZJ
000016880 7001_ $$0P:(DE-HGF)0$$aZeman, M.$$b4
000016880 7001_ $$0P:(DE-Juel1)130284$$aPieters, B.E.$$b5$$uFZJ
000016880 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.3640238$$gVol. 99, p. 111107$$p111107$$q99<111107$$tApplied physics letters$$v99$$x0003-6951$$y2011
000016880 8567_ $$uhttp://dx.doi.org/10.1063/1.3640238
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